Vendor
Information: X-Ray Fluorescence
HAZ-MET
920, 940 (Metorex Inc.)
Vendor
Information
Technology
Overview
Technology Description
Monitoring Capabilities
Specifications
Cost
Performance
| Vendor Information | |
| Metorex
Inc. 1900 N.E. Division St., Suite 204 Bend, Oregon 97701 USA http://www.metorex.com |
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| Contact | ||||
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James R. Pasmore VP Sales and Marketing Phone: (541) 385-6748 Fax: (541) 385-6750 product_info@metorex.com |
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Technology
Overview
Trade Name and/or Model Number assigned by vendor:
HAZ-MET 920, 940
Technology Scale: (Indicates
the operational status of the technology.)
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Full Scale - Available equipment is sized and commercially available for actual monitoring or measurement. | |
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Pilot Scale - Available equipment is of sufficient size to verify technology feasibility or establish the design and operating conditions for a full-scale system. However, it is not of the size typically used for a commercially available system. |
| | This technology is in the Superfund Innovative Technology Evaluation (SITE) Program. |
| | This technology is being tested, or has been tested, in EPA SITE Emerging Technology Program. |
| | This technology is in the Consortium for Site Characterization Technology's (CSCT) verification program. |
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| The Metorex HAZ-MET 920 is a portable, battery operated, field hardened, x-ray fluorescence spectrometer for in-situ and on-site (intrusive) analysis of inorganics in soil, air, water, lead-in-paint, etc. The HAZ-MET 920 and the newly introduced HAZ-MET 940 both include a small hand-held analysis probe containing a radioisotope source of x-rays for atomic excitation of the sample, a method of reproducible sample presentation, and a high resolution proportional detector (13% resolution) or solid state Si(Li) detector (2.5%). The element range of the probes is from atomic number 13 to 92 (aluminum to uranium). The sensitivity level is from ppm to 100% concentration. Metorex also offers the X-MET series analyzers, which are identical to the Haz-Mets in hardware, but utilize a software package which is geared more toward alloy analysis. The X-MET series is focused more toward industrial quality control and mining applications. The probes connect into a 2048 microchannel electronic pulse height analyzer. The pulse height spectrum is analyzed by proprietary XRF software installed on a Metorex supplied or customer supplied DOS based IBM PC compatible lap-top or desk top computer, or a Metorex 940 which is a Metorex designed DOS based computer, especially miniaturized and adapted for use in harsh field environments. By pressing the start button on the probe, x-rays generated by the source are allowed to "shine" on the sample. This causes atomic excitation of atoms of the elements present in the sample. This excitation energy is released in the form of x-rays which are characteristic of the individual elements. These characteristic x-rays which represent a specific quantum energy "signature" for each atom (element). The electromagnetic energy thus produced is transduced by the detector into electrical pulse height equivalents. These various pulse heights are sent to the pulse height analyzer (PHA) and sorted by energy (element) into pulse height regions that represent the element(s) in the sample. The microprocessors'(standard IBM compatible PC) software computes quantitative data for each measureable element by storing calibration response curves for each element in the form of empirically determined response coefficients or, alternatively, computes element concentrations directly based on the backscatter fundamental parameters method (also called "standardless" calibration method). The XRF software allows direct storage (data logging) of all final measurement results as well as raw data and operating parameters. Qualitative data is provided through the spectral data display for each sample x-ray spectrum which can be stored and displayed on the VGA monitor in full color with KLM energy markers for each element. All data can be saved in a tabular format and exported directly into commercial data processing programs such as WordPerfect, Lotus, Excel, etc. The proprietary XRF software is easy-to-use, menu driven format with familiar pull-down menu screens. In-situ measurements can be taken directly on the surface of the sample (ie; soil), or samples can be taken intrusively and collected in 31mm dia x-ray cups for placement in the probe and measurement on-site. In-situ measurement times are generally the average of several measurements per sample location, each on the order of 10-100 seconds. On-site (trailer or back of station wagon for example) analysis of collected samples may allow more rigorous sample preparation, more representative specimens for analysis, and therefore warrant longer measurement times of, typically, 100-300 seconds. Complete applications support, parts and service, accessories, operational training, and equipment warranty is provided by Metorex. |
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Due to limitations in the intensity of isotope sources that can be produced,
detection limits are at best in the range of ppm. Depending on
the density of the matrix and interelement interferences they can be
as low as 10ppm or as high as a few hundred ppm. Correction for significant matrix changes (eg; as from silaceous to calciferous matrix) is required with empirical calibration methods. Backscatter fundamental parameters (standardless) calibration, on the other hand, will provide estimated mathematical corrections for matrix changes automatically. However, the empirical calibration method, when used properly (with site-specific calibration suite), will almost always provide more accurate results. Beryllium cannot be analyzed with the XRF method because the detector's window is made of Beryllium. Due to transmission losses in air, the weaker light element x-rays, elements below atomic number 19 have higher detection limits. As the element becomes lighter than 19, the detection limit becomes higher down to the lowest element possible with portable XRF, aluminum. With aluminum the detection limit is in the range of 1000 ppm. Variations in the following sample characteristics relative to the calibration standards can be sources of error: Particle size Sample presentation Moisture Sample representativeness Bulk density Measurement time (too short) Matrix Sample non-homogeneity |
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The XRF or FPXRF (field portable xrf) technology has been applied to
inorganic contaminants in soil for more than a decade with good success. Many
publications exist which describe the capablilities and limitations
to on site and in situ screening. The HAZ-MET has been proven
to achieve EPA Level I accuracy and precision (EPA/540/G87/003). With
the newer solid state probe, the Si(Li) detector, Level II precision
and accuracy has been demonstrated. Corraboration with laboratory AA and ICP indicates it is reasonable to expect to achieve a correlation factor of R = .9, when the sample is fully extracted with strong digestion, and instrumental methods of calibration and operation procedures from the manufacturer are followed correctly. Like most manufacturers, Meteorex offers comprehensive references, training and application support services to assist the novice. |
| Actual | Potential | |
|---|---|---|
| Soil (in situ) | ||
| Soil (ex situ) | ||
| Sludge (does not include municipal sewage sludge) | ||
| Solid (for example slag) | ||
| Air particulates and aerosols | ||
| Saturated sediment (ex situ) | ||
| Saturated sediment (in situ) |
| Actual | Potential | |
|---|---|---|
| Organic pesticides/herbicides | ||
| Heavy metals | ||
| Nonmetallic toxic elements | ||
| Radioactive metals | ||
| Inorganic cyanides | ||
| Inorganic corrosives | ||
| Organometallic pesticides/herbicides |
| Actual | Potential | |
|---|---|---|
| Agriculture Applications | ||
| Battery Recycling/Disposal | ||
| Chlor-alkali Manufacturing | ||
| Electroplating | ||
| Industrial Landfills | ||
| Inorganic/Organic Pigments | ||
| Machine Shops | ||
| Metal Ore Mining and Smelting | ||
| Municipal Landfills | ||
| Munitions Manufacturing/Storage | ||
| Paint/Ink Formulation/Use | ||
| Petroleum Refining and Reuse | ||
| Photographic Products | ||
| Plastics Manufacturing | ||
| Pulp and Paper Industry | ||
| Other Inorganic Chemical Manufacturing/Use | ||
| Semiconductor Manufacturing | ||
| Rubber Manufacturing | ||
| Wood Preserving | ||
| Uranium Mining | ||
| Uranium Mining |
| Component | Height | Width | Length | Weight |
|---|---|---|---|---|
| Entire unit | 3.9inch(es) | 10.8inch(es) | 12.2inch(es) | 4.7kilogram(s) |
The shipment must include documentation that it complies with federal shipping requirements (see 49 CFR 173.421-1 and 173.422 for details).
| The Metorex 900 series HAZ-MET's are equipped with either a solid state (Si(Li) or proportional counter detector contained in a hand held probe. The basic configuration includes: a disc operating system (DOS)-based, field-hardened portable, battery operated PC, XRF software, X-MET PC System (XPCS), and the analysis probe with excitation source. The XPCS contains a 2048-channel multi-channel analyzer (MCA) that is used to collect, analyze and display the x-ray pulse-height spectrum. The high resolution Si(Li) detector is liquid nitrogen cooled by a 0.5 liter dewar built into the probe. This allows 8-12 hours of field use before refill. The gas-filled proportional detector operates at ambient temperature. The following radioisotope excitation sources are offer: Fe-55, Cd-109, and Am-241. Dual source configurations are available. All software is menu driven. The technology is calibrated from the factory, or can be field calibrated using either empirical calibration or standardless-fundamental parameters with backscatter methods (FP). Empirical calibration requires a set of synthetic "site-typical" or analyzed "site-specific" samples for the initial calibration. FP calibration requires one certified standard. A "check sample" (QA/QC sample) facility allows calibrations to be maintained for months to years without recalibration. With a calibrated instrument the HAZ-MET is used either in-situ after clearing away non-representative material from the soil surface, or intrusively for samples collected and analyzed in cups. The operator measures each grid location for the prescribed analysis time (dependent on precision and accuracy required), typically 10 seconds to 300 seconds, then reads and records or electronically logs results in instrument memory. It is possible to analyze 50 or more soil samples per 8-10 hour day with intrusive sampling, rigorous sample preparation, and long measurement times (200-300 seconds per sample) and up to 400 samples per day with in-situ screening (or minimal sample preparation) and short (10-100 seconds per sample) measurement times. The following are steps involved for in-situ screening: 1. Prior to use, factory calibration is checked, or instrument is calibrated using a suite of calibration samples (empirical method), or one fully characterized standard (fundamental parameters method). 2. System performance test is done using check sample (QA/QC sample) measurement. 3. The probe is placed on the soil surface and the measurement is started. 4. Results are logged. The following are steps involved in intrusive sample analysis: 1. Prior to use, factory calibration is checked, or instrument is calibrated using a suite of calibration samples (empirical method), or one fully characterized standard (fundamental parameters method). 2. System performance test is done using check sample (QA/QC sample) measurement. 3. Samples are collected and prepared according to accepted protocols (usually drying, sieving, grinding, and homogenizing then filling x-ray cup for measurement). 4. Samples are placed on probe and measured. 5. Results are logged. |
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$1,000 per day (Unit) |
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$2 per liter (Unit) |
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Technology
Performance
Operating Conditions(tempurature, moisture, etc.)
Matrix and environment conditions that may interfere with the performance
of this technology.
Matrix
Soil Texture
Saturated
Moisture
Unsaturated
Environmental Conditions
Information not provided.
Can this technology be operated successfully outside (i.e. a controlled environment
is not necessary)?
No
Data Type and Interpretation
This technology produces:
Qualitative (yes/no, absense or presense)
Quantitative
(specific number)
Semi-Quantitative
(measurement within range)
Data manipulation required time to obtain usable results:
None, the technology automatically produces usable data.
Sample Throughput/Measurement Frequency - how long it takes to generate
one useable data point. Throughput is measured by the total time required
to obtain the data divided by the total number of data points.
40 per hour(units)
Development or Bench Scale Studies
Information
not provided.
Estimated range of qualtity or size of targetmaterial needed to test the fesibility
of this technology.
Information not provided.
Total number of bench-scale studies conducted on actual target materials from
diffrent sources or sites. Studies pertaining to the same site once, regardless
of the number of diffrent target materials.
0
Precision and Accuracy
Maximum measurement precision of the instrument.
not
provided
Maximum measurement accuracy of the instrument.
not
provided
Contaminant of Concern, Method
of Detection Limit and Operational Range
Information not provided.
Literature
and Technical References:
Information not provided.