Results: X-Ray Fluorescence

General
Past use of Technique/Technology
Verification/Evaluation Reports
Vendor/Instrument Information


General

Use: X-ray fluorescence (XRF) spectrometry is a non-destructive, analytical method used primarily to detect heavy metals in soil/solids samples.

Description:

XRF spectrometry uses primarily x-rays to irradiate a sample, which causes elements in the sample to emit secondary radiation of a characteristic wavelength. Two basic types of detectors are used to detect and analyze the secondary radiation:

  1. Wavelength-dispersive XRF spectrometry uses a crystal to diffract the x-rays, as the ranges of angular positions are scanned using a proportional or scintillation detector (an extremely sensitive instrument that can be used to detect alpha, beta, gamma, and x-radiation).

  2. Energy-dispersive XRF spectrometry uses a solid-state, Si(Li) detector from which peaks representing pulse-height distributions of the x-ray spectra can be analyzed.

The elements in the sample are identified by the wavelengths of the emitted x-rays while the concentrations of the elements are determined by the intensity of the x-rays. Sample preparation is minimal compared to conventional analytical techniques. XRF spectrometry allows for simultaneous determination of several elements. Portable energy-dispersive XRF instruments are now available, and the more accurate wave length XRF instruments can be used in mobile laboratories. The portable energy-dispersive XRF instruments can be used for scanning the ground surface to determine the prescence of metals without collecting a sample for analysis.

Analytes:

7. Metals

Media:

Soil/Sediment Water Gas/Air
BETTER BETTER Requires extraction
Selectivity: Technique measures the contaminant directly.
Susceptibility to Interference: Low.
Detection Limits : 10-100 ppm (soil); 0.5-10 ppm (water). Detection limits range from 20 - 1,000 ppm depending on vendor, unit type, and element analyzed. For portable instruments, detection limits typically are an order of magnitude higher than ICP-AES.
Turnaround Time per Sample: Minutes.
Applicable To:
Screen/Identify Characterize Concentration/Extent Cleanup Performance Long-Term Monitoring
BETTER ADEQUATE BETTER ADEQUATE
Quantitative Data Capability: Produces quantitative data.
Technology Status: Commercially available and routinely used field techonology.
Certification/Verification: Technology has participated in CalEPA certification and/or CSCT verification program.
Relative Cost per Analysis: Least expensive.

Limitations:

ASTM Standards/EPA Methods:

No applicable ASTM standards or EPA methods are cited for this technology.


Past use of Technique/Technology:

Data for these projects comes from the Field Analytical and Site Characterization Technologies Summary of Applications (EPA-542-R-97-011)

Number of sites: 39

Documented Past Use


Verification/Evaluation Reports:

SITE (MMTP)
ETV
CSCT
Cal/Cert


Vendor/Instrument Information:

Metorex Inc.
  OFFERED TECHNOLOGIES:
  HAZ-MET 920, 940
 
Advanced Analytical Products & Services
  OFFERED TECHNOLOGIES:
  Opti-Thin EDXRF
    REPRESENTATIVE SITES:
    Los Alamos National Laboratory
    Sandia National Laboratory
    U.S. Geological Survey
    Walsh Associates
     
Asoma Instruments, Inc.
  OFFERED TECHNOLOGIES:
  Model 200, Model 200T, Model 300T
    REPRESENTATIVE SITE:
    Consumer Power
     
C-Thru Technologies Corporation
  OFFERED TECHNOLOGIES:
  MAP Portable Assayer
    REPRESENTATIVE SITE:
    Representative Project Summary
     
Niton Corporation
  OFFERED TECHNOLOGIES:
  NITON XL Spectrum Analyzer
    REPRESENTATIVE SITES:
    Asarco
    Bangor Submarine Base
    New England urban lead in soil studies
    R.V. Hopkins
     
Rigaku/USA, Inc.
  OFFERED TECHNOLOGIES:
  MiniFlex + (2005)
     
Spectrace Instruments
  OFFERED TECHNOLOGIES:
  QuanX
    REPRESENTATIVE SITE:
    Sludge Disposal Facility
     
TN Spectrace
  OFFERED TECHNOLOGIES:
  Spectrace 9000